Boost Elevated-Temp Throughput:

Esterline Research & Design proudly presents the FAS300-H Frequency Acquisition System for high-throughput, elevated-temperature TCXO testing, frequency stability analysis, and multi-channel Allan Deviation (ADEV) measurement. Building on the scalable foundation of the FAS series, the FAS300-H-D is engineered to push the boundaries of production-volume aging, warm-up, and precision oscillator characterization.

A robust card cage and backplane architecture streamline system integration and enable rapid, repeatable testing across a wide range of package types.

Key Features

🔹 High-Density Elevated-Temperature Testing — Supports up to 1280 DUTs per system with 16-up or 64-up test cards, maximizing chamber utilization and production throughput.

🔹 Zero-Dead-Time Frequency Acquisition — Continuous, multi-channel measurement with independent counters per position, eliminating switching delays and improving data resolution.

🔹 Scalable Backplane Architecture — DIN-connected test cards simplify expansion and swapping while maintaining system integrity.

🔹 Allan Deviation on All Channels — Simultaneous per-channel ADEV analysis reduces cost per channel and allows real-time performance insights.

🔹 Flexible DUT Support — Low-cost clamshell and surface-mount adapters accommodate virtually all XO/VCXO/TCXO footprints with optional input conditioning, prescaling, and low-noise designs for sensitive measurements.

🔹 Programmable Voltage and Current Monitoring — Each channel offers independent EFC/VCC control and live current readback for automated test scripting.

🔹 Up to 100 MHz Bandwidth — Supports CMOS-level signals out of the box with optional adapters for other waveforms.

Optional Modules and Customization

The FAS300-H-D system can be tailored for advanced production workflows:

• DFS100 Synthesizer Module – Ultra-low phase noise mixing reference for high-precision ADEV. Each unit supports up to four backplanes.

• RFS100 Rubidium Standard – Optional 10 MHz reference for best-in-class long-term frequency stability.

• RCM100 Relay Control Module – Programmable relay outputs to control test chambers, indicator lights, or power sequencing logic.

System Integration & Ordering

Adapter cards are available for common package sizes (5×3.2mm, 3.2×2.5mm, etc.) or can be custom-built to match your application. Multiple power supply configurations are available, including support for high- or low-voltage TCXO types.

The FAS300-H-D integrates seamlessly with ERD's proven master controller and synthesizer infrastructure, creating a robust, modular test environment designed for years of high-volume use.

Now Available for Order
For configuration help, technical specs, or purchasing inquiries, contact Esterline Research & Design today at www.esterlineresearch.com or (717) 348-5326.