Increase your Throughput: FAS200 Test Systems

OTC008 Test card with clamshell socket adapters

Esterline Research & Design is proud to introduce the FAS200 OCXO Frequency Acquisition System, a next-generation solution for high-throughput OCXO testing, aging, and Allan Deviation (ADEV) analysis. The FAS200 builds on the proven FAS100 platform, enhancing scalability and reliability with a streamlined backplane architecture that eliminates excessive cabling, improving ease of use and long-term system stability.

Key Features

🔹 Simultaneous Frequency Acquisition – Supports multi-channel, zero-dead-time readings, allowing continuous OCXO aging and stability monitoring.

🔹 High-Precision Timing Analysis – Gate times from 10 milliseconds to 24 hours, with independent frequency counters per channel.

🔹 Scalable, High-Density OCXO Testing – Five-card backplane supports up to 80 OCXOs per system, with 8-up or 16-up DUT configurations per card.

🔹 Backplane-Driven Design – DIN connectors enable robust module swapping and streamlined connectivity, reducing interconnect complexity.

🔹 Independent Channel Configuration – Each OCXO test position features software-programmable EFC and VCC voltages, along with real-time current monitoring for automated testing.

🔹 Broad Frequency Range – Handles bandwidths up to 100 MHz, making it adaptable for a variety of precision applications.

🔹 Multi-Channel Allan Deviation (ADEV) Analysis – Unlike conventional single-channel ADEV systems, the FAS200 enables simultaneous per-channel ADEV calculations, significantly reducing per-channel costs while boosting throughput.

FAS200 system rack containing a master controller, power supply, and synthesizer.

Designed for High-Precision Applications

The FAS200 is designed to meet the demands of OCXO manufacturers, research labs, and high-precision industries requiring large-scale, room-temperature qualification of frequency sources. Ideal for:

• OCXO Aging & Warm-Up Testing
• Allan Deviation (ADEV) & Stability Analysis
• Production-Level OCXO Screening & Qualification
• GPS, Radar, SATCOM & Cellular Infrastructure Development
• Quantum Computing, AI Data Centers, and Test Instrumentation

Seamless Integration & Cost-Effective Scalability

The FAS200 enables multi-package OCXO testing with low-cost footprint adapters, allowing parallel evaluation of different OCXO models within the same system. By eliminating dead time and providing continuous aging measurements, it delivers unmatched efficiency for high-volume production and advanced research applications.

Availability & Contact Information

The FAS200 OCXO Frequency Acquisition System is now available for order! For more information, technical specifications, or purchasing inquiries, contact ERD today.