FAS300-H Burn-in Aging System for XO/VCXO/TCXO

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OCXO Aging and Room-Temperature ADEV System

Key Features

• Simultaneous frequency acquisition      
• Zero-dead-time readings
• Independent counter per channel
• Gate times of 10ms to 24 hours
• High channel-to-channel isolation
• Backplane Architecture
• 16 - 64 DUTs per card
• DIN connectors for robust swapping
  

Applications

• Enables room-temperature qualification of systems based on precision timing including: GPS, Radar, Radios, Guided Munitions, SATCOM, Cellular Infrastructure, Stratum-Compliant Devices, SARSAT, Test Instrumentation, Quantum Computing, A.I. Data Centers, and more.
• Ideal for OCXO manufacturers to test frequency-based parameters such as ADEV and warm-up at production volumes.