
NPA: FAS300-H Frequency Acquisition System
The FAS300-H Frequency Acquisition System is designed high-throughput, elevated-temperature TCXO testing, frequency stability analysis, and multi-channel Allan Deviation (ADEV) measurement.
The FAS300-H Frequency Acquisition System is designed high-throughput, elevated-temperature TCXO testing, frequency stability analysis, and multi-channel Allan Deviation (ADEV) measurement.
The FAS200 builds on the proven FAS100 platform, enhancing scalability and reliability with a streamlined backplane architecture that eliminates excessive cabling, improving ease of use and long-term system stability.
Optimize Your OCXO Aging Measurement Precision and Efficiency The FAS100 Frequency Acquisition System is an advanced solution designed specifically for simultaneous, zero-dead-time frequency measurements across multiple OCXO (Oven-Controlled Crystal Oscillator) channels, leveraging one or more FMS100-32 modules and managed seamlessly by an MCM100 Master Controller. Utilizing the heterodyne method along...
In frequency testing, precision and accuracy are non-negotiable, but achieving them often means sacrificing throughput. Sequential testing inherently carries several pitfalls. ERD’s simultaneous multi-channel frequency measurement systems directly resolve these common problems inherent in sequential testing.
Tailor-Made RF: Customizing Your Signal Distribution Network In our previous posts, we've explored the modular scalability of the FRM100 Frequency Reference Module paired with our DA-Series RF Distribution Amplifiers. But what if your system demands more flexibility—mixing waveforms, frequencies, or even integrating external RF sources? Mixed Waveform Outputs: Precision Customization...
Trim Effect is the distortion of an oscillator's frequency vs. temperature performance caused by changes in control voltage. Testing is essential to ensure the oscillator meets the required performance specifications, particularly in high-precision applications like defense and aerospace.